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SrTiO3 (STO) thin films of different thicknesses were deposited on MgAl2O4 (MAO) substrates to investigate the in-plane strain effect on the soft-mode frequency of the STO films. X-ray reciprocal space mapping (X-RSM) results indicate that there was no relaxation of the in-plane lattice strain of the STO films on MAO. Shifts in the soft-mode frequencies with a decrease in the film thickness were observed using terahertz time-domain spectroscopy (THz-TDS). However, despite the larger lattice mismatch between STO and MAO than that between STO and DyScO3 (DSO), the shifts in the soft-mode frequencies of the STO films on MAO were smaller than those on DSO. The results indicate that the soft-mode frequencies of the STO films on MAO are affected by the c-axis (out-of-plane) lengths.</span

advances in materials physics and chemistry

Thickness Dependence of Dielectric Characteristics of SrTiO&amp;lt;sub&amp;gt;3&amp;lt;/sub&amp;gt; Thin Films on MgAl&amp;lt;sub&amp;gt;2&amp;lt;/sub&amp;gt;O&amp;lt;sub&amp;gt;4&amp;lt;/sub&amp;gt; Substrates