Open AccessTime Resolved Photoluminescence Imaging for Carrier Lifetime Mapping of Silicon Wafers
Author(s) -
David Kiliani,
Gabriel Micard,
Bernd Raabe,
Giso Hahn
Publication year - 2010
Publication title -
eu pvsec
Language(s) - English
Resource type - Conference proceedings
DOI - 10.4229/25theupvsec2010-2co.4.2
Subject(s) - photoluminescence , wafer , silicon , materials science , optoelectronics , carrier lifetime
A method for time-resolved Photoluminescence Imaging using a high-resolution Si-CCD camera was developed. The use of a fast rotating shutter wheel decouples the obtained temporal resolution from the camera exposure time, making it possible to record the decay curve of free minority charge carriers. With this transient measurement, maps of the effective carrier lifetime can be generated for different carrier densities without the use of external calibration measurements.
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