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Two-dimensional X-ray diffraction pattern can be described by the diffraction intensity distribution in both 2θ and γ directions. The 2D pattern can be reduced to two kinds of profiles: 2θ-profile and γ-profile. The 2θ-profile can be evaluated for phase identification, crystal structure refinement and many applications with many existing algorithms and software. The γ-profile contains information on texture, stress, and crystal grain size. This article introduces the concept and fundamental algorithms for stress, texture and crystal size analysis by γ-profile analysis.

Gamma Profile Analysis for Stress, Texture and Grain Size