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In the present work, DDR3 zeolite crystals were synthesized using two different methods. The silica sources used to synthesize DDR3 crystals were tetramethoxysilane (TMOS) and Ludox-40. The resultant samples were characterized using X-ray Diffraction (XRD) and Field Emission Scanning Electron Microscope (FESEM). The XRD results showed that the peaks representing DDR3 structure were not obtained for the sample synthesized in 5 days at room temperature with ultrasonic pre-treatment of 3h using Ludox-40 as silica source. On the other hand, the XRD pattern obtained for the sample synthesized in 25 days at 160  o  C using TMOS as a silica source were similar with the XRD peaks reported in the literature. From these results, it can be concluded that the synthesis conditions of 25 days at 160  o  C using TMOS as silica source were the favorable conditions in obtaining DDR3 crystal structure.

Methods Comparison for the Synthesis of Deca-Dodecasil 3 Rhombohedral (DDR3) Zeolite Crystals