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Low-frequency electrical and optical noise characteristics of a high power white InGaN LED and the cross-correlation coefficient between these fluctuations are investigated during the long-term ageing experiment (28000 h). The analysis of cross-correlation shows that the correlated part of the low-frequency electrical noise, which indicates physical processes in the active area of the LED, varies during the ageing experiment. Two main stages are distinguished considering the rapid changes of the noise characteristics. The initial stage (after the first 1100 h) is followed by the decrease in the noise power at low forward currents and the increase in the light output. The final stage (after 28000 h) is characterized by a strong growth of the low-frequency noise, the decrease of the light output and the increase of the correlated part of electrical and optical fluctuations. These changes mean a failure in the active layer of the LED. The optical output decomposition into two spectral parts, the radiation generated by the LED chip and the radiation generated by the phosphor layer, enables evaluation of the phosphor layer influence on the degradation process of device optical characteristics. Despite the fact that this layer contributes to the variation of the LED chromatic properties, the cross-correlation analysis has shown that the phosphor layer does not act as a possible noise source during the ageing experiment.

Low-frequency noise characteristics of high-power white LED during long-term aging experiment