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The surface plasmon resonance (SPR) method combined with spectral ellipsometry was used to study the chemically formed octadecanthiol (ODT) monolayer on a gold film in Kretchmann configuration. Measurements were made with a commercial spectral ellipsometer GES-5 (SOPRA). The optical constants of an Au film and ODT at 1000 nm wavelength were determined by the best fit procedure from experimental data (Au: n = 0.202, k = 5.970 and ODT: n = 1.4, k = 0). Combination of the SPR method with advantages of phase measurements of ellipsometry demonstrated a substantial increase in sensitivity (more than one order of magnitude) compared with conventional ellipsometry.

Monolayer film analysis by total internal reflection ellipsometry