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This paper presents a comprehensive approach to the statistical characterization of impulse breakdown voltage under the effect of a DC sweep voltage. Several goodness-of-fit tests are applied to up-and-down test results obtained in the air-insulated rod-plane gap. Three distributions, normal, logistic, and Gumbel, are compared by means of the Kolmogorov--Smirnov goodness-of-fit test, and logistic distribution is also compared to 3-parameter Weibull distributions using the likelihood ratio test. Logistic distribution is found to be a possible alternative to normal and 3-parameter Weibull distributions.

Statistical approach for determining impulse breakdown voltage distribution under DC sweep voltage