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This study aimed to investigate the differential depletion charge density for (Ag, Cu, Ni) /n-Si/Al Schottky diodes which depend on ohmic contact temperatures. Ohmic contact temperature defines the Schottky diode parameters. Furthermore, ohmic temperature is concerned with diode quality. In general, depletion charge density is determined as depending on built-in potential. The differential depletion charge density is smaller than zero-voltage depletion charge density (V = 0, Vbi ≠ 0) in the case of forward bias and higher than the zero-voltage depletion charge density for reverse bias. When the depletion charge density formula was expanded into a series, new equations revealed appreciable results. Boundary-values were found for differ-ential depletion charge density using normal and expanded formulae.

Differential Depletion Charge Density of the Approximation of Schottky Diodes as Ohmic Annealed a Variety of Temperatures