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Texture feature description is a remarkable challenge in the fields of computer vision and pattern recognition. Since the traditional texture feature description method, the local binary pattern (LBP), is unable to acquire more detailed direction information and always sensitive to noise, we propose a novel method based on generalized Gabor direction pattern (GGDP) and weighted discrepancy measurement model (WDMM) to overcome those defects. Firstly, a novel patch-structure direction pattern (PDP) is proposed, which can extract rich feature information and be insensitive to noise. Then, motivated by searching for a description method that can explore richer and more discriminant texture features and reducing the local Gabor feature vector’s high dimension problem, we extend PDP to form the GGDP method with multi-channel Gabor space. Furthermore, WDMM, which can effectively measure the feature distance between two images, is presented for the classification and recognition of image samples. Simulated experiments on olivetti research laboratory (ORL), Carnegie Mellon University pose, illumination, and expression (CMUPIE) and Yale B face databases under different illumination or facial expression conditions indicate that the proposed method outperforms other existing classical methods

A Novel Texture Feature Description Method Based on the Generalized Gabor Direction Pattern and Weighted Discrepancy Measurement Model