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The emissivity is an important surface property parameter in many fields, including infrared temperature measurement. In this research, a symmetry theoretical model of directional spectral emissivity prediction is proposed based on Gaussian random rough surface theory. A numerical solution based on a matrix method is determined based on its symmetrical characteristics. Influences of the index of refraction n and the root mean square (RMS) roughness σrms on the directional spectrum emissivity ε are analyzed and discussed. The results indicate that surfaces with higher n and lower σrms tend to have a peak in high viewing angles. On the contrary, surfaces with lower n and higher σrms tend to have a peak in low viewing angles. Experimental verifications based on infrared (IR) temperature measurement of Inconel 718 sandblasted surfaces were carried out. This model would contribute to understand random rough surfaces and their emitting properties in fields including machining, process controlling, remote sensing, etc.

Theoretical Modeling and Analysis of Directional Spectrum Emissivity and Its Pattern for Random Rough Surfaces with a Matrix Method