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Transimpedance amplifiers (TIA) are widely used for front-end signal conditioning in many optical distance measuring applications in which high accuracy is often required. Small effects due to the real characteristics of the components and the parasitic elements in the circuit board may cause the error to rise to unacceptable levels. In this work we study these effects on the TIA delay time error and deduce analytic expressions, taking into account the trade-off between the uncertainties caused by the delay time instability and by the signal-to-noise ratio. A specific continuous-wave phase-shift case study is shown to illustrate the analysis, and further compared with real measurements. General strategies and conclusions, useful for designers of this kind of system, are extracted too. The study and results show that the delay time thermal stability is a key determinant factor in the measured distance accuracy and, without an adequate design, moderate temperature variations of the TIA can cause extremely high measurement errors.

Phase Stability under Thermal Drifts in Photodiode-Conditioning Transimpedance Amplifiers for Distance Metrology