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A transmission-type refractive index sensor, based on planar lightwave circuit (PLC) technology is proposed. In the proposed structure, we introduce a combination of coarse measurements, using the dependence of the angle of refraction and fine measurement, and the dependence of the phase on the refractive index to measure the absolute refractive index precisely, without expensive optical measurement equipment. The theoretical model of the proposed refractive index sensor is derived based on Fourier optics and transfer function to simulate its performance. The simulation results for the use of the 2.5%-Δ silica-based PLC technology indicate that the proposed structure has the potential to achieve a refractive index error of approximately 1 × 10 -6 RIU or less when a monitored power deviation of ±0.05 dB is accepted.

sensors

Design of Transmission-Type Refractive Index Sensor, Based on Silica Planar Lightwave Circuit Using Combination of Refractive Angle and Phase Measurements