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This study investigated the possibility of using visible and near-infrared (VIS/NIR) hyperspectral imaging techniques to discriminate viable and non-viable wheat seeds. Both sides of individual seeds were subjected to hyperspectral imaging (400-1000 nm) to acquire reflectance spectral data. Four spectral datasets, including the ventral groove side, reverse side, mean (the mean of two sides' spectra of every seed), and mixture datasets (two sides' spectra of every seed), were used to construct the models. Classification models, partial least squares discriminant analysis (PLS-DA), and support vector machines (SVM), coupled with some pre-processing methods and successive projections algorithm (SPA), were built for the identification of viable and non-viable seeds. Our results showed that the standard normal variate (SNV)-SPA-PLS-DA model had high classification accuracy for whole seeds (&gt;85.2%) and for viable seeds (&gt;89.5%), and that the prediction set was based on a mixed spectral dataset by only using 16 wavebands. After screening with this model, the final germination of the seed lot could be higher than 89.5%. Here, we develop a reliable methodology for predicting the viability of wheat seeds, showing that the VIS/NIR hyperspectral imaging is an accurate technique for the classification of viable and non-viable wheat seeds in a non-destructive manner.

A Reliable Methodology for Determining Seed Viability by Using Hyperspectral Data from Two Sides of Wheat Seeds