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Leaf area index (LAI) is an important indicator of plant growth and yield that can be monitored by remote sensing. Several models were constructed using datasets derived from SRS and STR sampling methods to determine the optimal model for soybean (multiple strains) LAI inversion for the whole crop growth period and a single growth period. Random forest (RF), artificial neural network (ANN), and support vector machine (SVM) regression models were compared with a partial least-squares regression (PLS) model. The RF model yielded the highest precision, accuracy, and stability with V-R2, SDR2, V-RMSE, and SDRMSE values of 0.741, 0.031, 0.106, and 0.005, respectively, over the whole growth period based on STR sampling. The ANN model had the highest precision, accuracy, and stability (0.452, 0.132, 0.086, and 0.009, respectively) over a single growth phase based on STR sampling. The precision, accuracy, and stability of the RF, ANN, and SVM models were improved by inclusion of STR sampling. The RF model is suitable for estimating LAI when sample plots and variation are relatively large (i.e., the whole growth period or more than one growth period). The ANN model is more appropriate for estimating LAI when sample plots and variation are relatively low (i.e., a single growth period).

Retrieving Soybean Leaf Area Index from Unmanned Aerial Vehicle Hyperspectral Remote Sensing: Analysis of RF, ANN, and SVM Regression Models