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Timely and nondestructive monitoring of leaf area index (LAI) using remote sensing techniques is crucial for precise and efficient management of crops. In this paper, a new spectral index (SI) for estimating LAI of winter wheat (Triticum aestivum L.) is proposed on the basis of field hyperspectral measurements. A simple index based on the empirical relationships between LAIs and SIs of all available two-waveband combinations from hyperspectral data is developed by considering the difference between reflectance values at 760 and 739 nm (DSIR760–R739 = R760 – R739). Among published and newly developed SIs, DSIR760–R739 exhibited a significant and strong linear relationship with LAI and showed outstanding performance in LAI assessments. The permissible bandwidths for broad-band DSIR760–R739 investigated using simulated reflectance were 5 nm for both 760 and 739 nm center wavelengths. The results indicate that the linear regression model based on the narrow-band and broad-band DSIR760–R739 is a simple but accurate method for timely and nondestructive monitoring of LAI

Spectral Index for Quantifying Leaf Area Index of Winter Wheat by Field Hyperspectral Measurements: A Case Study in Gifu Prefecture, Central Japan