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High-transparency polymers, called optical polymers (OPs), are used in many thin-film devices, for which the knowledge of film thickness ( h ) and refractive index ( n ) is generally required. Spectrophotometry is a cost-effective, simple and fast non-destructive method often used to determine these parameters simultaneously, but its application is limited to films where  h  > 500 nm. Here, a simple spectrophotometric method is reported to obtain simultaneously the  n  and  h  of a sub-micron OP film (down to values of a few tenths of a nm) from its transmission spectrum. The method is valid for any OP where the  n  dispersion curve follows a two-coefficient Cauchy function and complies with a certain equation involving  n  at two different wavelengths. Remarkably, such an equation is determined through the analysis of  n  data for a wide set of commercial OPs, and its general validity is demonstrated. Films of various OPs (pristine or doped with fluorescent compounds), typically used in applications such as thin-film organic lasers, are prepared, and  n  and  h  are simultaneously determined with the proposed procedure. The success of the method is confirmed with variable-angle spectroscopic ellipsometry.

Simultaneous Determination of Refractive Index and Thickness of Submicron Optical Polymer Films from Transmission Spectra