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The research field of two dimensional (2D) materials strongly relies onoptical microscopy characterization tools to identify atomically thin materialsand to determine their number of layers. Moreover, optical microscopy-basedtechniques opened the door to study the optical properties of thesenanomaterials. We presented a comprehensive study of the differentialreflectance spectra of 2D semiconducting transition metal dichalcogenides(TMDCs), MoS2, MoSe2, WS2, and WSe2, with thickness ranging from one layer upto six layers. We analyzed the thickness-dependent energy of the differentexcitonic features, indicating the change in the band structure of thedifferent TMDC materials with the number of layers. Our work provided a routeto employ differential reflectance spectroscopy for determining the number oflayers of MoS2, MoSe2, WS2, and WSe2.

Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2