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When the lifetime of an electronic component does not reach the required level, it can be enhanced by means of the paralleling current sharing backup system or the redundant backup system. The lifetime of the redundant backup system is the sum of lifetimes of all electronic components, which is the maximum of all the electronic components’ lifetimes, compared with the lifetime of the parallel current sharing backup system. For the purpose of enhancing products’ reliability, electronic goods are usually designed with spare electronic components. If it is assumed that there are m−1 redundant backup components for each electronic product, then the lifetime of the electronic product will be distributed as a Gamma distribution with two parameters—m and λ, where λ is the mean for each lifetime of each electronic component. According to numerous studies, the sample size is not large, as it takes a long time to test the lifetime of an electronic product, and enterprises consider cost and timeliness. This paper concerns the performance index of the lifetime of the electronic product. Therefore, based on the confidence interval, this paper aims to develop a fuzzy testing model. As this model can integrate past data and expert experience, the testing accuracy can be retained despite small-sized samples. In fact, through adopting the testing model proposed by this paper, companies can make precise and intelligent decisions instantly with the use of small-sized samples to grasp the opportunities for improvement.

Confidence-Interval-Based Fuzzy Testing for the Lifetime Performance Index of Electronic Product