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As an anisotropic material, the unique optoelectronic properties of black phosphorus are obviously anisotropic. Therefore, non-destructive and fast identification of its crystalline orientation is an important condition for its application in optoelectronics research field. Identifying the crystalline orientation of black phosphorus through A g  1 and A g  2 modes under the parallel polarization has high requirements on the Raman system, while in the nonanalyzer configuration, the crystalline orientation of the thick black phosphorus may not be identified through A g  1 and A g  2 modes. This work proposes a new method to identify the crystalline orientation of black phosphorus of different thicknesses. This method is conducted under the nonanalyzer configuration by B 2g mode. The results show that B 2g mode has a good consistency in the identification of crystalline orientations. In this paper, a theoretical model is established to study the angle-resolved Raman results of B 2g mode. The new method can accurately identify the crystalline orientation with different layers of black phosphorus without misidentification.

materials

Orientation Identification of the Black Phosphorus with Different Thickness Based on B2g Mode Using a Micro-Raman Spectroscope under a Nonanalyzer Configuration