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The properties of 20 wt % CeO2 and 21 wt % Ce0.5Zr0.5O2 films, deposited onto a γ-Al2O3 by Atomic Layer Deposition (ALD), were compared to bulk Ce0.5Zr0.5O2 and γ-Al2O3-supported samples on which 20 wt % CeO2 or 21 wt % CeO2–ZrO2 were deposited by impregnation. Following calcination to 1073 K, the ALD-prepared catalysts showed much lower XRD peak intensities, implying that these samples existed as thin films, rather than larger crystallites. Following the addition of 1 wt % Pd to each of the supports, the ALD-prepared samples exhibited much higher rates for CO oxidation due to better interfacial contact between the Pd and ceria-containing phases. The redox properties of the ALD samples and bulk Ce0.5Zr0.5O2 were measured by determining the oxidation state of the ceria as a function of the H2:H2O ratio using flow titration and coulometric titration. The 20 wt % CeO2 ALD film exhibited similar thermodynamics to that measured previously for a sample prepared by impregnation. However, the sample with 21 wt % Ce0.5Zr0.5O2 on γ-Al2O3 reduced at a much higherP   O 2and showed evidence for transition between the Ce0.5Zr0.5O2 and Ce0.5Zr0.5O1.75 phases

Investigation of the Thermodynamic Properties of Surface Ceria and Ceria–Zirconia Solid Solution Films Prepared by Atomic Layer Deposition on Al2O3