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The object detection algorithm of the PCB (Printed Circuit Board) assembly scene based on CNN (Convolutional Neural Network) can significantly improve the production capacity of intelligent manufacturing of electronic products. However, the object class imbalance in the PCB assembly scene, the multi-scale feature imbalance, and the positive/negative sample imbalance in the CNN have become critical problems restricting object detection performance. Based on YOLOv3, this paper proposes a class-balanced Train/Val (Training set/Validation set) split method for object class imbalance, an additional feature fusion strategy for multi-scale feature imbalance, and an efficient anchor concept for positive/negative sample imbalance. These three contributions are Balanced-YOLOv3. After experimental verification, compared with other YOLOv3 series algorithms, the mAP@.5 (Mean Average Precision at Intersection over Union threshold 0.5) and mAP@.5:.95 (average mAP over different Intersection over Union thresholds, from 0.5 to 0.95, step 0.05) of Balanced-YOLOv3 have achieved the best results and ranked third in the metrics of parameter and inference time. Compared with other current anchor-based object detection algorithms, Balanced-YOLOv3 has excellent detection performance and low computational complexity, which effectively solves the problem of imbalanced object detection in PCB assembly scenarios.

Balanced-YOLOv3: Addressing the Imbalance Problem of Object Detection in PCB Assembly Scene