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A 2-then-1-bit/cycle noise-shaping successive-approximation register (SAR) analog-to-digital converter (ADC) for high sampling rate and high resolution is presented. The conversion consists of two phases of a coarse 2-bit/cycle SAR conversion for high speed and a fine 1-bit/cycle noise-shaping SAR conversion for high accuracy. The coarse conversion is performed by both voltage and time comparison for low power consumption. A redundancy after the coarse conversion corrects the error caused by a jitter noise during the time comparison. Additionally, a mismatch error between signal and reference paths is eliminated with the help of a tail-current-sharing comparator. The proposed ADC was designed in a 28 nm CMOS process, and the simulation result shows a 68.2 dB signal-to-noise distortion (SNDR) for a sampling rate of 480 MS/s and a bandwidth of 60 MHz with good energy efficiency.

Conception and Simulation of a 2-Then-1-Bit/Cycle Noise-Shaping SAR ADC