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The paper investigates the variation of friction force ( F x  ) during reciprocating sliding tests on nanocrystalline diamond (NCD) films. The analysis of the friction behavior during the run-in period is the focus of the study. The NCD films were grown using microwave plasma-enhanced chemical vapor deposition (MW-PECVD) on single-crystalline diamond SCD(110) substrates. Reciprocating sliding tests were conducted under 500 and 2000 g of normal load using Si 3 N 4  balls as a counter body. The friction force permanently varies during the test, namely  F x   value can locally increase or decrease in each cycle of sliding. The distribution of friction force drops ( dF x  ) was extracted from the experimental data using a specially developed program. The analysis revealed a power-law distribution  f −µ   of  dF x   for the early stage of the run-in with the exponent value ( µ ) in the range from 0.6 to 2.9. In addition, the frequency power spectrum of  F x   time series follows power-law distribution  f −α   with  α  value in the range of 1.0–2.0, with the highest values (1.6–2.0) for the initial stage of the run-in. No power-law distribution of  dF x   was found for the later stage of the run-in and the steady-state periods of sliding with the exception for periods where a relatively extended decrease of coefficient of friction (COF) was observed. The asperity interlocking leads to the stick-slip like sliding at the early stage of the run-in. This tribological behavior can be related to the self-organized criticality (SOC). The emergence of dissipative structures at the later stages of the run-in, namely the formation of ripples, carbonaceous tribolayer, etc., can be associated with the self-organization (SO).

Transition from Self-Organized Criticality into Self-Organization during Sliding Si3N4 Balls against Nanocrystalline Diamond Films