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In this paper, a new approach for fault detection and location of open switch faults in the closed-loop inverter fed vector controlled drives of Electric Multiple Units is proposed. Spectral kurtosis (SK) based on Choi–Williams distribution (CWD) as a statistical tool can effectively indicate the presence of transients and locations in the frequency domain. Wavelet-packet energy Shannon entropy (WPESE) is appropriate for the transient changes detection of complex non-linear and non-stationary signals. Based on the analyses of currents in normal and fault conditions, SK based on CWD and WPESE are combined with the DC component method. SK based on CWD and WPESE are used for the fault detection, and the DC component method is used for the fault localization. This approach can diagnose the specific locations of faulty Insulated Gate Bipolar Transistors (IGBTs) with high accuracy, and it requires no additional devices. Experiments on the RT-LAB platform are carried out and the experimental results verify the feasibility and effectiveness of the diagnosis method

Traction Inverter Open Switch Fault Diagnosis Based on Choi–Williams Distribution Spectral Kurtosis and Wavelet-Packet Energy Shannon Entropy