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CdZnTe (CZT) films were grown by closed space sublimation (CSS) method on (111)-oriented CZT wafers, non-oriented CZT wafers and FTO substrates. The compositional and morphological properties of CZT films on different substrates were characterized by scanning electron microscopy (SEM) and atomic force microscopy (AFM), which indicated that CZT films grown on (111)-oriented CZT wafers had low dislocation density and high Zn composition. X-ray diffraction (XRD) measurements confirmed that CZT films grown on (111)-oriented CZT wafers had the best crystal quality. The I-V and DC photoconductivity measurements indicated that CZT films on (111)-oriented CZT wafer had good carrier transport performance. The energy spectra of CZT films grown on (111)-oriented CZT wafer presented that it had a good response to the nuclear radiation under 241Am.

Deposition of CdZnTe Films with CSS Method on Different Substrates for Nuclear Radiation Detector Applications