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Optical sensors fabricated in zeolite nanoparticle composite films rely on changes in their optical properties (refractive index, n, and thickness, d) to produce a measurable response in the presence of a target analyte. Here, ellipsometry is used to characterize the changes in optical properties of Linde Type L (LTL) zeolite thin films in the presence of Cu2+ ions in solution, with a view to improving the design of optical sensors that involve the change of n and/or d due to the adsorption of Cu2+ ions. The suitability of two different ellipsometry techniques (single wavelength and spectroscopic) for the evaluation of changes in n and d of both undoped and zeolite-doped films during exposure to water and Cu2+-containing solutions was investigated. The influence of pre-immersion thermal treatment conditions on sensor response was also studied. Due to the high temporal resolution, single wavelength ellipsometry facilitated the identification of a Cu2+ concentration response immediately after Cu2+ introduction, indicating that the single wavelength technique is suitable for dynamic studies of sensor–analyte interactions over short time scales. In comparison, spectroscopic ellipsometry produced a robust analysis of absolute changes in film n and d, as well as yielding insight into the net influence of competing and simultaneous changes in n and d inside the zeolite-doped films arising due to water adsorption and the ion exchange of potassium (K+) cations by copper (Cu2+).

In-Situ Ellipsometric Study of the Optical Properties of LTL-Doped Thin Film Sensors for Copper(II) Ion Detection