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Eigen-frequency, compared with mode shape and damping, is a more practical and reliable dynamic feature to portray structural damage. The frequency contour-line method relying on this feature is a representative method to identify damage in beam-type structures. Although this method has been increasingly applied in the area of damage identification, it has two significant deficiencies: inefficiency in establishing the eigen-frequency panorama; and incompetence to identify cracks in noisy conditions, considerably impairing the effectiveness in identifying structural damage. To overcome these deficiencies, a novel method, termed the frequency contour-strip method, is developed for the first time. This method is derived by extending the frequency contour line of 1D to frequency contour strip of 2D. The advantages of the frequency contour-strip method are twofold: (i) it uses the isosurface function to instantly produce the eigen-frequency panorama with a computational efficiency several orders of magnitude higher than that of the frequency contour-line method; and (ii) it can accommodate the effect of random noise on damage identification, thereby thoroughly overcoming the deficiencies of the frequency contour-line method. With these merits, the frequency contour-strip method can characterize damage in beam-type structures with more efficiency, greater accuracy, and stronger robustness against noise. The proof of concept of the proposed method is performed on an analytical model of a Timoshenko beam bearing a crack and the effectiveness of the method is experimentally validated via crack identification in a steel beam.

Frequency Contour-Strip Method for Characterization of Damage in Structures under Noisy Conditions