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Multiferroic systems are of great interest for technological applications. To improve the fabrication of thin films, stereometric and fractal analysis of surface morphology have been extensively performed to understand the influence of physical parameters on the quality of spatial patterns. In this work, GaMnO3 was synthesized and thin films were deposited on Pt(111)/TiO2/SiO2/Si substrates using a spin coating apparatus to study the correlation between their stereometric and fractal parameters. All films were studied by X-ray diffraction (XRD), where the structure and microstructure of the film sintered at 850 °C was investigated by Rietveld refinement. Topographic maps of the films were obtained using an atomic force microscope (AFM) in tapping mode. The results show that the film sintered at 850 °C exhibited a clear formation of a GdMnO3 orthorhombic structure with crystallite size of ~14 nm and a microstrain higher than other values reported in the literature. Its surface morphology presented a rougher topography, which was confirmed by the height parameters. Topographic differences due to different asymmetries and shapes of the height distributions between the films were observed. Specific stereometric parameters also showed differences in the morphology and microtexture of the films. Qualitative rendering obtained by commercial image processing software revealed substantial differences between the microtextures of the films. Fractal and advanced fractal parameters showed that the film sintered at 850 °C had greater spatial complexity, which was due to their higher topographic roughness, lower surface percolation and greater topographic uniformity, being dominated by low dominant special frequencies. Our combination of stereometric and fractal measurements can be useful to improve the fabrication process by optimizing spatial patterns as a function of the sintering temperature of the film.

Fractal-Stereometric Correlation of Nanoscale Spatial Patterns of GdMnO3 Thin Films Deposited by Spin Coating