English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

As embedded software is closely related to hardware equipment, any defect in embedded software can lead to major accidents. Thus, all defects must be collected, classified, and tested based on their severity. In the pure software field, a method of deriving core defects already exists, enabling the collection and classification of all possible defects. However, in the embedded software field, studies that have collected and categorized relevant defects into an integrated perspective are scarce, and none of them have identified core defects. Therefore, the present study collected embedded software defects worldwide and identified 12 types of embedded software defect classifications through iterative consensus processes with embedded software experts. The impact relation map of the defects was drawn using the decision-making trial and evaluation laboratory (DEMATEL) method, which analyzes the influence relationship between elements. As a result of analyzing the impact relation map, the following core embedded software defects were derived: hardware interrupt, external interface, timing error, device error, and task management. All defects can be tested using this defect classification. Moreover, knowing the correct test order of all defects can eliminate critical defects and improve the reliability of embedded systems.

The Derivation of Defect Priorities and Core Defects through Impact Relationship Analysis between Embedded Software Defects