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Fixed pattern noise (FPN) has always been an important factor affecting the imaging quality of CMOS image sensor (CIS). However, the current scene-based FPN removal methods mostly focus on the image itself, and seldom consider the structure information of the FPN, resulting in various undesirable noise removal effects. This paper presents a scene-based FPN correction method: the low rank sparse variational method (LRSUTV). It combines not only the continuity of the image itself, but also the structural and statistical characteristics of the stripes. At the same time, the low frequency information of the image is combined to achieve adaptive adjustment of some parameters, which simplifies the process of parameter adjustment, to a certain extent. With the help of adaptive parameter adjustment strategy, LRSUTV shows good performance under different intensity of stripe noise, and has high robustness.

CMOS Fixed Pattern Noise Removal Based on Low Rank Sparse Variational Method