Genetic Mapping of Quantitative Trait Loci Associated with Plant Height and Yield Component Traits in a Wheat (Triticum aestivum L.) Doubled Haploid Population Derived from Tugela-DN × Elands | Zendy

AI Assistant Blog Pricing

Genetic Mapping of Quantitative Trait Loci Associated with Plant Height and Yield Component Traits in a Wheat (Triticum aestivum L.) Doubled Haploid Population Derived from Tugela-DN × Elands

Details

The content you want is available to Zendy users.Already have an account? Click here. to sign in.