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In this paper, a new two-parameter logistic testlet response theory model for dichotomous items is proposed by introducing testlet discrimination parameters to model the local dependence among items within a common testlet. In addition, a highly effective Bayesian sampling algorithm based on auxiliary variables is proposed to estimate the testlet effect models. The new algorithm not only avoids the Metropolis-Hastings algorithm boring adjustment the turning parameters to achieve an appropriate acceptance probability, but also overcomes the dependence of the Gibbs sampling algorithm on the conjugate prior distribution. Compared with the traditional Bayesian estimation methods, the advantages of the new algorithm are analyzed from the various types of prior distributions. Based on the Markov chain Monte Carlo (MCMC) output, two Bayesian model assessment methods are investigated concerning the goodness of fit between models. Finally, three simulation studies and an empirical example analysis are given to further illustrate the advantages of the new testlet effect model and Bayesian sampling algorithm.

A Novel and Highly Effective Bayesian Sampling Algorithm Based on the Auxiliary Variables to Estimate the Testlet Effect Models