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Critical leaf nutrient concentrations have often been used to diagnose the nutritional status of crops. Determining critical leaf potassium (K) concentrations for the maximum root dry matter (RDM) will provide a reliable means of linking leaf K nutrient concentrations to the yield of sweet potato. Three field experiments, using varying K application rates (0–300 kg K ha −1 ) and two sweet potato cultivars, were performed in the Zhejiang Province of China. A new critical leaf K curve (K leaf ) based on the maximum RDM was determined to assess K nutrition in sweet potato and described by the equationK    leaf    =  4  .  55  ×  RD    M    max    -  0  .  075. A critical root K curve (K root ) based on the maximum RDM was also determined to assess K nutrition and described by the equationK    root    =  2  .  36  ×  RD    M    max    -  0  .  087. The K nutrition index (KNI) was constructed to identify the situations of K-limiting and non-K-limiting treatments. The leaf KNI (KNI leaf ) ranged from 0.56 to 1.17, and the root K KNI (KNI root ) ranged from 0.52 to 1.35 during the growth period of sweet potato. The results showed that the critical leaf K concentration curve can be used as an accurate leaf K status diagnostic tool at critical growth stages that connected leaf nutrient concentration and sweet potato tuber yield. This K curve will contribute to K management of sweet potato during its growth period in China.

A New Curve of Critical Leaf Potassium Concentration Based on the Maximum Root Dry Matter for Diagnosing Potassium Nutritional Status of Sweet Potato