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Organic donor–acceptor bulk heterojunction are attracting wide interests for solar cell applications due to solution processability, mechanical flexibility, and low cost. The photovoltaic performance of such thin film is strongly dependent on vertical phase separation of each component. Although film-depth-dependent light absorption spectra measured by non- in situ  methods have been used to investigate the film-depth profiling of organic semiconducting thin films, the  in situ  measurement is still not well-resolved. In this work, we propose an  in situ  measurement method in combination with a self-developed  in situ  instrument, which integrates a capacitive coupled plasma generator, a light source, and a spectrometer. This  in situ  method and instrument are easily accessible and easily equipped in laboratories of the organic electronics, which could be used to conveniently investigate the film-depth-dependent optical and electronic properties.

In situ Measuring Film-Depth-Dependent Light Absorption Spectra for Organic Photovoltaics