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Distribution of TiO 2  dopants and SiO 2  impurities in the bimodal microstructure of Al 2 O 3  with anisotropic and equiaxed grains is systematically analyzed using analytical electron microscopy (AEM). The TiO 2 -doped ceramic materials were hot-pressed at 1500 °C in a reducing environment. Different amounts of Ti solutes in the anisotropic or equiaxed grains were observed after removal of the contamination signal stemming from Ti on the surface. SiO 2  and TiO 2  exhibit a selective segregation behavior. The boundary between the equiaxed grains is segregated mainly by TiO 2  but the boundary at the (0001) basal plane of anisotropic grains is covered with a thin amorphous film made up of mostly SiO 2 . Precipitation of Al 2 TiO 5  occurs at high TiO 2  doping levels.

Effect of TiO 2 –SiO 2 distribution on bimodal microstructure of TiO 2 -doped α-Al 2 O 3 ceramics