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In order to provide a solid basis for the correlation of microstructure and hydrogen isotope retention in tungsten, reference samples with different microstructures were prepared from a single batch of polycrystalline tungsten by standardised polishing and heat treatment procedures. Representative samples were analysed by scanning electron microscopy and scanning transmission electron microscopy as well as by electron backscatter diffraction. We show that if the annealing temperature is increased from 1 200 to 1 500 K, practically only the density of dislocations and grain boundaries with very small misorientations of less than 2° is reduced, while for annealing at 1 700 and 2 000 K, also the density of high-angle grain boundaries is reduced due to grain growth. Furthermore, the dislocation density is reduced by nearly two orders of magnitude compared to tungsten annealed at 1 200 K. We also comment on two different textures on the front and rear side of the samples that were observed both by X-ray diffraction and EBSD.

Quantitative Microstructure and Defect Density Analysis of Polycrystalline Tungsten Reference Samples after Different Heat Treatments