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Optical metallography and electron metallography (SEM and TEM) techniques are applied to the characterization of additive-layer manufactured products and prototypes by electron beam melting (EBM) of Ti-6Al-4V atomized precursor powder. In addition, microstructure-property comparisons are made by hardness and tensile test measurements which demonstrate prospects for controlled property-performance variations by varying process parameters including temperature profiles and cooling rates in manufactured prototypes.

Metallographic Characterization of Additive-Layer Manufactured Products by Electron Beam Melting of Ti-6Al-4V Powder