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Annealed AlMn alloys with different amounts of manganese (0.4; 0.7 and 1 wt.-%) were analyzed with texture and microstructure imaging techniques using high-energy synchrotron radiation. These techniques allow getting reliable information about grain shape and grain size distribution in the different crystallographic directions due to high orientation and location resolution. The observed trends of the grain growth in dependence on the AlMn alloys composition and the crystallographic directions, are well correlated with the different texture components occurring with increasing annealing time. In comparison to the SEM/EBSD technique, these methods allow to get orientation dependent information about the grain size and shape related with additionally good statistics.

Grain Growth Analyses of AlMn Alloys Using Texture and Microstructure Imaging Techniques with High-Energy Synchrotron Radiation