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Recently the focused ion beam (FIB) tool has been successfully used to prepare site-specific geological specimens for subsequent analysis by TEM, and as a stand-alone instrument for micromachining of materials such as diamond. FIB enables to prepare a TEM foil from the specific location of interest. TEM foils with the dimensions 20 × 10 × 0.150 micrometer can be cut from nearly any sample by means of a Ga-ion beam. The preparation of a TEM-ready foil with similar dimensions takes about 4 hours in a fully automated process, which is significantly faster than conventional argon ion milling. It is this unique possibility of site-specific TEM foil preparation, which enables TEM investigation of submicron-sized mineral inclusions in mantle minerals such as diamond, garnet or olivine, thus providing an insight into the pressure-temperature conditions and chemical composition of the Earth's mantle during formation of the encapsulating minerals. A FEI FIB200 instrument is operated at the GFZ Potsdam since more than two years and TEM foils from many rock-forming minerals such as olivine, garnet, pyroxene, amphibole, quartz, apatite or glass, metals, ceramic materials and even microfossils have been successfully prepared and subsequently investigated by TEM. The first finding of nanometre-sized diamond aggregates in melt inclusions enclosed in a silicate mineral (pyroxene) in mantle xenoliths from Hawaiian lavas illustrates the enormous potential of this technique. Another novel application of FIB in geosciences is micromachining diamonds, which are used for high-pressure diamond anvil cells (DAC).

Focused Ion Beam (FIB): Applications in Micro- and Nanoanalysis in Geosciences and Applied Mineralogy