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The stability of the microstructure of pure silver processed by equal channel angular pressing at room temperature was studied by transmission electron microscopy and X-ray line profile analysis. After processing by 1 pass the microstructure was stable, whereas after 8 passes a static recovery/recrystallization of the severely deformed microstructure was observed a long time after deformation when the material was stored at room temperature. This unusual behavior is attributed to the high degree of dislocation dissociation due to the very low stacking fault energy of silver. The highly dissociated dislocations may be annihilated a long time after deformation due to thermal activation assisted by stresses which evolve in the severely deformed microstructures.

Stability of microstructure in silver processed by severe plastic deformation