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Dynamic recovery in Stage III of strain hardening of pure fcc metals has been known for decades and has been associated with dislocation cell formation and refinement in scale with increasing plastic shear resistance when this exceeds a critical and temperature-dependent threshold level. Its rate controlling process had been attributed by Seeger 50 years ago to massive cross slip of screw dislocation groups circumventing Lomer-Cottrell type linear sessile dislocations blocking the primary slip system. Consideration of this cross slip-controlled mechanism has persisted in various modified forms in the literature up to the present, even though it is not consistent with the cellular dislocation structure of Stage III, and its evolution. Here a new mechanism is proposed in which dynamic recovery occurs through the systematic removal of short Lomer – Cottrell type sessile dislocation segments, i. e. LC locks, in the cell walls by statistical processes stimulated by the impingement of glide dislocations on cell walls when the applied stress exceeds a temperature-dependent threshold shear resistance τ III .

A new model of dynamic recovery for Stage III of pure fcc metals without cross slip