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We have studied the structural properties and the magnetization density profiles in multilayers of the Heusler phase CoMnGe with three different spacer layers: V, Au, and AlO, using hard X-ray scattering, soft X-ray resonant magnetic scattering, and polarized neutron reflectivity. We have found that the spacer layer has a significant effect on the magnetization profile of the CoMnGe layer. In all cases the interlayers at the top and the bottom of the Heusler layer exhibit a reduced magnetic moment, the thickness of which depends on the spacer layer and increases from 0.5 nm for V, to 0.6 nm for Au and 1 nm for AlO.

international journal of materials research

Heusler films and multilayers: X-ray resonant magnetic scattering and polarized neutron reflectivity studies on the relation between structure and magnetism