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Highly porous glass ceramic scaffolds are compared by X-ray refraction topography and optical microscopic image analysis. The micro pore structures of the spongosia-like material are characterised in order to optimise sample preparation and sinter process parameters. In contrast to the specific internal surfaces determined by optical microscopy, significantly higher values are found by X-ray refraction. This discrepancy is explained by additional scanning electron microscopy detecting various types of sub-micron interfaces within the scaffold super-structure. The study demonstrates the necessity of both methods in order to gain more reliable information. More generally, this is also recommended for characterising other porous materials of very different structural dimensions.

Characterisation of highly porous glass ceramic scaffolds: X-ray refraction topography and optical microscopic image analysis