English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

52 eJ. Surf. Sci. Nanotech., 10 (2012) 292. で主な部分発表 1 九州大学総合理工学府物質理工学専攻(〒8168580 福岡県春 日市春日公園 61) Fig. 1 FIM images observed during and after the ˆeldassisted O2 etching of a W〈111〉 tip. (a) FIM image of a hemispherical singlecrystal W〈111〉tip prepared from an electrochemically etched tip by ˆeld evaporation at potentials up to 4.4 kV. (b)(f) FIM images captured from a realtime movie during the O2 etching reaction. The bias voltage was reduced from 4.4 kV to 1.6 kV. The O2 gas was gradually shut oŠ from (d) to (f).

Development of LEED Apparatus Using Field-Emission Tips