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Hysteresis Circuit for Stable Fabrication of Scanning Probe Microscope Tips Shingo ISHIWATA1,2, Atsushi SUZUKI1,3, Shunsuke OKA2 and Ken-ichi SHUDO1,2 1Faculty of Engineering/Science and 2Graduate School of Engineering, Yokohama National University Tokiwadai 795, Hodogaya-ku, Yokohama-shi, Kanagawa 2408501, Japan 3Current A‹liation: Graduate School of Arts and Sciences, University of Tokyo