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A dynamic element matching (DEM) approach to ADC testing is introduced. Two variants of this methods are introduced and compared; a deterministic DEM method and a random DEM method. With both variants, a highly non-ideal DAC is used to generate an excitation for a DUT that has effective linearity that far exceeds that of the DAC. Simulation results show that both methods can be used for testing of ADCs. The deterministic DEM (DDEM) offers potential for a substantial reduction in the number of samples when compared with a random DEM approach with the same measurement accuracy. It is shown that the concept of using DEM for signal generation in a test environment finds applications well-beyond ADC testing. The DDEM approach offers potential for use in both production test and BIST environments.

Precise linear signal generation with nonideal components and deterministic dynamic element matching