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Review of the book Historical Technology, Materials and Conservation: sem and Microanalysis edited by Nigel Meeks, Caroline Cartwright, Andrew Meek and Aude Mongiatti, printed by Archetype Publications in association with the British Museum, London in 2012. This book contains written versions of the presentations given at the two-day conference entitled “SEM and Microanalysis in the Study of Historical Technology, Materials and Conservation” held at the British Museum on 9-10 September 2010, organized by the Department of Conservation and Scientific Research of the British Museum, in association with Hitachi High-Technology Europe.

Miradas tecnológicas: Historical Technology, Materials and Conservation: SEM and Microanalysis