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A method of optimal test frequency selection for analog circuit fault diagnosis is proposed. The method simulates the circuit faulty states only in the bands with highest fault sensitivity and that reduces part of simulation cost. Test frequency selection is considered as a multi-objective optimization problem, discrete particle swarm algorithm is used as a new approach to get optimal test frequency sets. An example shows that the proposed method is effective in frequency selection and works more efficiently compared with genetic algorithm. KeywordsTest frequency selection; Discrete particle swarm algorithm; Analog circuit; Fitness function

Test Frequency Selection of Analog Circuit Based on Discrete Particle Swarm Algorithm