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A completely automatically near-field mapping system is developed within IRSEEM (Research Institute for Electronic Embedded Systems) in order to determine electromagnetic field radiated by electronic systems. This test bench uses a 3D positioning system of the probe to make accurate measurements. The main element of this measurement tool is the probe. This paper presents a characterization of the open-ended coaxial probe which is used to measure the normal component of the electric field.

CHARACTERIZATION OF THE OPEN-ENDED COAXIAL PROBE USED FOR NEAR-FIELD MEASUREMENTS IN EMC APPLICATIONS