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Reliability Properties of Residual Life Time and Inactivity Time of Series and Parallel System The concepts of residual life time and inactivity time are extensively used in reliability theory for modeling life time data. In this paper we prove some new results on stochastic comparisons of residual life time and inactivity time in series and parallel systems. These results are in addition to the existing results of Li & Zhang (2003) and Li & Lu (2003). We also present sufficient conditions for aging properties of the residual life time and inactivity life time of series and parallel systems. Some examples from Weibull and Gompertz distributions are provided to support the results as well.